Correlation of EBIC and SWBXT Imaged Defects and Epilayer Growth Pits in 6H-SiC Schottky Diodes

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Periodical:

Materials Science Forum (Volumes 338-342)

Edited by:

Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer

Pages:

489-492

DOI:

10.4028/www.scientific.net/MSF.338-342.489

Citation:

C.M. Schnabel et al., "Correlation of EBIC and SWBXT Imaged Defects and Epilayer Growth Pits in 6H-SiC Schottky Diodes", Materials Science Forum, Vols. 338-342, pp. 489-492, 2000

Online since:

May 2000

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$35.00

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