Deformation Tests on 4H-SiC Single Crystals between 900°C and 1360°C and the Microstructure of the Deformed Samples

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Periodical:

Materials Science Forum (Volumes 338-342)

Edited by:

Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer

Pages:

517-520

DOI:

10.4028/www.scientific.net/MSF.338-342.517

Citation:

J. L. Demenet et al., "Deformation Tests on 4H-SiC Single Crystals between 900°C and 1360°C and the Microstructure of the Deformed Samples", Materials Science Forum, Vols. 338-342, pp. 517-520, 2000

Online since:

May 2000

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$35.00

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