Electrical Characteristics and Surface Morphology for Arsenic Ion-Implanted 4H-SiC at High Temperature

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Periodical:

Materials Science Forum (Volumes 338-342)

Edited by:

Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer

Pages:

865-868

DOI:

10.4028/www.scientific.net/MSF.338-342.865

Citation:

J. Senzaki et al., "Electrical Characteristics and Surface Morphology for Arsenic Ion-Implanted 4H-SiC at High Temperature", Materials Science Forum, Vols. 338-342, pp. 865-868, 2000

Online since:

May 2000

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$35.00

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