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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356X-ray Diffraction, Micro-Raman and Birefringence...

X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

283-286

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.283

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Online since:

January 2001

Authors:

Etienne Pernot, Michel Mermoux, J. Kreisel, O. Chaix-Pluchery, Petra Pernot-Rejmánková, Mikhail Anikin, Bernard Pelissier, A.M. Glazer, Roland Madar

Keywords:

Birefringence, Raman Spectroscopy Imaging, X-Ray Topography

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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