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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356X-Ray Diffraction Line Profile Analysis of Neutron...

X-Ray Diffraction Line Profile Analysis of Neutron Irradiated 6H-SiC

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

287-290

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.287

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Online since:

January 2001

Authors:

Christoph Seitz, Andreas Magerl, Hans Heissenstein, Reinhard Helbig

Keywords:

Crystal Defects, Neutron Irradiation, Structure, X-Ray Diffraction (XRD)

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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