X-Ray Diffraction Line Profile Analysis of Neutron Irradiated 6H-SiC

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 353-356)

Edited by:

G. Pensl, D. Stephani and M. Hundhausen

Pages:

287-290

Citation:

C. Seitz et al., "X-Ray Diffraction Line Profile Analysis of Neutron Irradiated 6H-SiC", Materials Science Forum, Vols. 353-356, pp. 287-290, 2001

Online since:

January 2001

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.