Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography

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Periodical:

Materials Science Forum (Volumes 389-393)

Edited by:

S. Yoshida, S. Nishino, H. Harima and T. Kimoto

Pages:

391-394

DOI:

10.4028/www.scientific.net/MSF.389-393.391

Citation:

M. Dudley et al., "Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography", Materials Science Forum, Vols. 389-393, pp. 391-394, 2002

Online since:

April 2002

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