Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 389-393)

Edited by:

S. Yoshida, S. Nishino, H. Harima and T. Kimoto

Pages:

431-434

Citation:

A. Galeckas et al., "Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes", Materials Science Forum, Vols. 389-393, pp. 431-434, 2002

Online since:

April 2002

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.