Investigation of Mass Transport during SiC PVT Growth Using Digital X-Ray Imaging, 13C Labeling of Source Material and Numerical Modeling

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Periodical:

Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

9-12

DOI:

10.4028/www.scientific.net/MSF.433-436.9

Citation:

P. J. Wellmann et al., "Investigation of Mass Transport during SiC PVT Growth Using Digital X-Ray Imaging, 13C Labeling of Source Material and Numerical Modeling", Materials Science Forum, Vols. 433-436, pp. 9-12, 2003

Online since:

September 2003

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$35.00

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