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HomeMaterials Science ForumMaterials Science Forum Vols. 455-456Dynamic Characterization of Large Area Image...

Dynamic Characterization of Large Area Image Sensing Structures Based on a-SiC:H

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Advanced Materials Forum II

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Periodical:

Materials Science Forum (Volumes 455-456)

Pages:

86-90

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.455-456.86

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Online since:

May 2004

Authors:

M. Fernandes, M. Vieira, Rodrigo Martins

Keywords:

Amorphous Silicon, Image Sensor, Large Area

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[1] M. Vieira, M. Fernandes, J. Martins, P. Louro, A. Maçarico, R. Schwarz, and M. Schubert: IEEE Sensors Journal, Vol 1 No. 2 (2001), p.158.

[2] M. Vieira, M. Fernandes, J. Martins, P. Louro, A. Maçarico, R. Schwarz, and M. Schubert: Mat. Res. Soc. Symp. Proc. S. Francisco, USA, April (2000).

[3] P. Louro, Yu. Vygranenko, R. Schwarz, M. Fernandes, M. Vieira, J. Gloeckner, M. Schubert: Mat. Res. Soc. Symp. Vol. 664 (2001).

[4] M. Vieira , M. Fernandes, P. Louro, Y. Vygranenko, R. Schwarz, and M. Schubert, Mat. Res. Soc. Symp. Proc. Vol. 664 (2001).

[5] M. Fernandes, Yu. Vygranenko, M. Vieira, Applied Surface Science 184 1-4 (2001), p.408.

[6] C. Koch, M. Ito, M. Schubert, and J. H. Werner: Mat. Res. Soc. Symp. Proc. Vol. 575 (1999), p.749.

[7] P. Louro, M. Vieira, Yu. Vygranenko, M. Fernandes, R. Schwarz, M. Schubert, Applied Surface Science, 184 (2001) 144-149.

DOI: 10.1016/s0169-4332(01)00488-3