Excess Carrier Lifetime Mapping for Bulk SiC Wafers by Microwave Photoconductivity Decay Method and Its Relationship with Structural Defect Distribution

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

505-508

DOI:

10.4028/www.scientific.net/MSF.457-460.505

Citation:

M. Kato et al., "Excess Carrier Lifetime Mapping for Bulk SiC Wafers by Microwave Photoconductivity Decay Method and Its Relationship with Structural Defect Distribution ", Materials Science Forum, Vols. 457-460, pp. 505-508, 2004

Online since:

June 2004

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$35.00

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