Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

513-516

DOI:

10.4028/www.scientific.net/MSF.457-460.513

Citation:

S. A. Reshanov et al., "Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy", Materials Science Forum, Vols. 457-460, pp. 513-516, 2004

Online since:

June 2004

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$35.00

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