Influence of Irradiation on Excess Currents in SiC pn Structures

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Abstract:

Excess currents of the different nature in 6H-SiC pn structures of the different origin and parameters were investigated. The effect of the suppression of the forward and reverse excess currents were observed after 0.9 MeV electron (dose 5x1016 ÷ 1.6x1017 cm-2) and 8 MeV proton (dose 5x1015 cm-2) irradiation for structures with shunts which is probably due to the presence of relatively small inhomogeneities. The shunts in another group of pn structures probably are more high capability and they are more stable against degradation during irradiation.

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Materials Science Forum (Volumes 483-485)

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1001-1004

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May 2005

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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[1] L.W. Auderman et al.: Proc. of the Conf. on Silicon Carbide, Pergamon Press (1960), p.388.

Google Scholar

[2] I.V. Ryzhikov et al.: Electron. Techn. Vol. 4 (1981), p.9.

Google Scholar

[3] A.M. Strel'chuk et al.: Mat. Sci. and Eng. Vol. B46 (1997), p.231.

Google Scholar

[4] A.M. Strel'chuk et al.: Mat. Sci. and Eng. Vol. B61-62 (1999), p.441.

Google Scholar

[5] C. -T. Sah, R.N. Noyce, W. Shockley: Proc. of the I.R.E. Vol. 45 (1957), p.1228.

Google Scholar

[6] A.M. Strel'chuk, N.S. Savkina: Mat. Sci. and Eng.: Vol. B80 (2001), p.378.

Google Scholar

[7] V.V. Evstropov, A.M. Strel'chuk: Semiconductors Vol. 30 (1996), p.52.

Google Scholar