Relationship between the EPR SI-5 Signal and the 0.65 eV Electron Trap in 4H- and 6H-SiC Polytypes

Abstract:

• Periodical: Materials Science Forum (Volumes 527-529)
• Pages: 547-550
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.527-529.547
• Online since: October 2006
• Authors: N.Y. Garces, W.E. Carlos, E.R. Glaser, Sung Wook Huh, Hun Jae Chung, Saurav Nigam, A.Y. Polyakov, Marek Skowronski
• Keywords: DLTS, Electron Paramagnetic Resonance (EPR)

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