Relationship between the EPR SI-5 Signal and the 0.65 eV Electron Trap in 4H- and 6H-SiC Polytypes

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Periodical:

Materials Science Forum (Volumes 527-529)

Edited by:

Robert P. Devaty, David J. Larkin and Stephen E. Saddow

Pages:

547-550

DOI:

10.4028/www.scientific.net/MSF.527-529.547

Citation:

N.Y. Garces et al., "Relationship between the EPR SI-5 Signal and the 0.65 eV Electron Trap in 4H- and 6H-SiC Polytypes", Materials Science Forum, Vols. 527-529, pp. 547-550, 2006

Online since:

October 2006

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$35.00

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