Structure of the 3C-SiC(100) 5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence X-Ray Diffraction

M. Silly; H. Enriquez; J. Roy; M. D'Angelo; P. Soukiassian; T. Schuelli; M. Noblet; G. Renaud

doi:10.4028/www.scientific.net/MSF.556-557.533

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HomeMaterials Science ForumMaterials Science Forum Vols. 556-557Structure of the 3C-SiC(100) 5x2 Surface...

Structure of the 3C-SiC(100) 5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence X-Ray Diffraction

Abstract:

In order to give experimental insights on the atomic structure of the Si atomic wires developing on the β-SiC(100) surface, we use synchrotron radiation-based x-ray diffraction at grazing incidence to study a network of such atomic lines in a 5x2 surface array. Our results lead to an accurate surface and sub-surface structure determination evidencing a structure in agreement with a two adlayer symmetric dimer reconstruction. This atomic structure is significantly different from the 3x2 surface structure, giving new insights on the Si atomic lines stability.

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Materials Science Forum (Volumes 556-557)

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533-536

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.556-557.533

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Online since:

September 2007

Authors:

M. Silly, H. Enriquez, J. Roy, M. D'Angelo, P. Soukiassian, T. Schuelli, M. Noblet, G. Renaud

Keywords:

Atomic Lines, Dimerization, Grazing Incidence X-Ray Diffractometry (GI-XRD), Surface Reconstruction, Synchrotron Radiation (XRD)

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