Structure of the 3C-SiC(100) 5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence X-Ray Diffraction

Abstract:

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In order to give experimental insights on the atomic structure of the Si atomic wires developing on the β-SiC(100) surface, we use synchrotron radiation-based x-ray diffraction at grazing incidence to study a network of such atomic lines in a 5x2 surface array. Our results lead to an accurate surface and sub-surface structure determination evidencing a structure in agreement with a two adlayer symmetric dimer reconstruction. This atomic structure is significantly different from the 3x2 surface structure, giving new insights on the Si atomic lines stability.

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Periodical:

Materials Science Forum (Volumes 556-557)

Edited by:

N. Wright, C.M. Johnson, K. Vassilevski, I. Nikitina and A. Horsfall

Pages:

533-536

Citation:

M. Silly et al., "Structure of the 3C-SiC(100) 5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence X-Ray Diffraction ", Materials Science Forum, Vols. 556-557, pp. 533-536, 2007

Online since:

September 2007

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$38.00

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DOI: https://doi.org/10.1016/s0169-4332(00)00225-7

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