Raman Scattering and X-Ray Absorption from CVD Grown 3C-SiC on Si

Abstract:

FTIR, Visible and UV Raman scattering, as well as synchrotron radiation X-ray absorption, in combination, have been employed to investigate a series of CVD grown 3C-SiC/Si (100). Significant results on the optical and atomic bonding properties are obtained from these comparative studies.

• Periodical: Materials Science Forum (Volumes 717-720)
• Pages: 505-508
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.717-720.505
• Online since: May 2012
• Authors: Zhe Chuan Feng, Cheng Chen, Qiang Xu, Suwan P. Mendis, Ling Yun Jang, Chin Che Tin, Kung Yen Lee, Chee Wee Liu, Zhengyun Wu, Zhi Ren Qiu
• Keywords: 3C-SiC, Bond Length, Raman Scattering, Synchrotron Radiation, X-Ray Absorption

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