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Heteroepitaxial Growth of 3C-SiC on Polar Faces of 6H-SiC Substrates, TEM Investigations
Abstract:
Abstract Results of an epitaxial growth of 3C-SiC epilayers on Si (0001) and C(000¯1) faces of hexagonal 6H-SiC substrates are described. TEM study of grown layers as well as interface between cubic and hexagonal polytypes is presented. Difference between the layers on the Si and C faces are discussed.
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267-270
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Online since:
January 2013
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© 2013 Trans Tech Publications Ltd. All Rights Reserved
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