Materials Science Forum Vols. 83-87

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https://doi.org/10.4028/www.scientific.net/MSF.83-87

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Paper Title Page

Identification of Band Gap States in Silicon by Deep Level Transient Spectroscopy on Radioactive Impurities

Authors: J.W. Petersen, Jacob Nielsen

1103

Microscopy of Frenkel Pairs in Semiconductors by Nuclear Techniques

Authors: R. Sielemann, H. Hässlein, M. Brüssler, H. Metzner

1109

Modern Muon Spectroscopic Methods in Semiconductor Physics

Authors: R.L. Lichti, C.D. Lamp, S.R. Kreitzman, R.F. Kiefl, J.W. Schneider, Ch. Niedermayer, K. Chow, T. Pfiz, T.L. Estle, S.A. Dodds, B. Hitti, R.C. Duvarney

1115

Muon Stopping Sites in Semiconductors from Decay-Positron Channeling

Authors: H. Simmler, P. Eschle, H. Keller, W. Kündig, W. Odermatt, B.D. Patterson, I.M. Savić, J.W. Schneider, B. Stäuble-Pümpin, U. Straumann, P. Truöl

1121

Polarized Spectroscopy of Complex Luminescence Centers

Authors: Sergei S. Ostapenko, Moissei K. Sheinkman

1127

ONP Spectroscopy of Defects in Silicon

Authors: Nikolai T. Bagraev, Igor S. Polovtsev

1135

Nuclear Spin Polarization by Optical Pumping of Nitrogen Impurities in Semiconductors

Authors: Kouichi Murakami, Kazusato Hara, Kohzoh Masuda

1141

On the Analysis of Digital DLTS Data

Authors: C.A.B. Ball, A.B. Conibear