History and Recent Developments of Packaging Technology for SiC Power Devices

Article Preview

Abstract:

Packaging plays an important role to allow the full potential of silicon carbide devices to be realised. The physical properties of silicon carbide will allow devices to operate with junction temperatures well above 200 °C, but today standard-packaged SiC products are limited to a maximum junction temperature of 175 °C. The limitation lies in the packaging, because a power device package is a complex structure consisting of many components of different materials and with correspondingly different thermal properties. As such, the assembly technologies define both the performance and lifetime of discrete packages and power modules. In this paper we give an insight of packaging technology for SiC devices from the beginning in the mid-1980s through to the state-of-the-art of today. In addition, new packaging technologies to enable power SiC devices to operate up to 200 °C are discussed.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

1043-1048

Citation:

Online since:

May 2016

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2016 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] B. Passmore, High Temperature / High Voltage Packaging Using Wide Bandgap Power Devices, ECPE SiC & GaN User Forum, Coventry (UK), (2015).

Google Scholar

[2] Ph. G. Neudeck et al., Extreme temperature 6H-SiC JFET integrated circuit technology, in: P. Friedrichs, T. Kimoto, L. Ley, G. Pensl (Eds. ), Silicon Carbide, Vol. 2, WILEY-VCH Verlag GmbH &Co. KGaA, Weinheim, 2010, 121-155.

DOI: 10.1002/9783527629077.ch6

Google Scholar

[3] P. G. Neudeck, D. J. Spry, L. -Y. Chen, G. M. Beheim, R. S. Okojie, C. W. Chang, R. D. Meredith, T. L. Ferrier, L. J. Evans, M. J. Krasowski, and N. F. Prokop, IEEE Electron Device Lett. 29, 456 (2008).

DOI: 10.1109/led.2008.919787

Google Scholar

[4] http: /www. cree. com/About-Cree/History-and-Milestones/Milestones.

Google Scholar

[5] R. Bayerer et al., Model for Power Cycling lifetime of IGBT Modules at various factors influencing lifetime, Proceedings CIPS 2008, March 11-13, 2008, Nuremberg, Germany.

Google Scholar

[6] S. Kraft, A: Schletz, M. März M., Reliability of Silver Sintering on DBC and DBA Substrates for Power Electronic Applications, Proceedings CIPS 2012, March 6-8, 2012, Nuremberg, Germany.

Google Scholar

[7] N. Heuck, R. Bayerer, S. Krasel, F. Otto, R. Speckels, K. Guth, Proceedings of the ISPSD15, Hong Kong, pp.321-324.

Google Scholar

[8] K. Guth et al., New assembly and interconnects beyond sintering methods, Proceedings PCIM Nuremberg 2010, May 4-6, 2010, Nuremberg, Germany.

Google Scholar

[9] Ch. Herold et al., Power cycling capability of Modules with SiC-Diodes, Proceedings CIPS 2014, February 25-27, 2014, Nuremberg, Germany.

Google Scholar

[10] L. Tischert, N. Heuck, J. Lutz, Proceedings of the EPE 2015, Geneva Switzerland.

Google Scholar

[11] Bayerer et al., Power Circuit Design for clean switching, Proceedings CIPS 2010, March 16-18, 2010, Nuremberg, Germany.

Google Scholar