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HomeSolid State PhenomenaSolid State Phenomena Vols. 145-146Surface Texturization and Interface Passivation of...

Surface Texturization and Interface Passivation of Mono-Crystalline Silicon Substrates by Wet Chemical Treatments

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Periodical:

Solid State Phenomena (Volumes 145-146)

Pages:

223-226

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.145-146.223

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Online since:

January 2009

Authors:

W. Sievert, K.U. Zimmermann, B. Hartmann, C. Klimm, K. Jacob, Heike Angermann

Keywords:

H-Termination, Light Trapping, Scanning Electron Microscope (SEM), Si Surface Texturization, Surface Photo Voltage (SPV), UV-NIR-Reflectance, Wet Chemical Etching

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© 2009 Trans Tech Publications Ltd. All Rights Reserved

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