Ultra Clean Processing of Semiconductor Surfaces IX

Ultra Clean Processing of Semiconductor Surfaces IX

Subtitle:

UCPSS 2008

Description:

Volume is indexed by Thomson Reuters CPCI-S (WoS).
The contents of this publication include every conceivable issue related to contamination, cleaning and surface preparation during mainstream large-scale integrated circuit manufacture. Typically, silicon is used as the main semiconductor substrate. However, other semiconducting materials such as SiGe and SiC are currently being used in the source-sink junction areas, and materials such as Ge and III-V compounds are being considered for the transistor channel region of future-generation devices.

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Info:

Editors:
Paul Mertens, Marc Meuris and Marc Heyns
THEMA:
TGM
BISAC:
SCI077000
Details:
Selected, peer reviewed papers from the 9th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), held in Bruges, Belgium, September 22-24, 2008
Pages:
412
Year:
2009
ISBN-13 (softcover):
9783908451648
ISBN-13 (CD):
9783908454038
ISBN-13 (eBook):
9783038132820
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