Engineering Research
Advanced Engineering Forum
Applied Mechanics and Materials
Engineering Chemistry
Engineering Innovations
Journal of Biomimetics, Biomaterials and Biomedical Engineering
International Journal of Engineering Research in Africa
Materials Science
Advanced Materials Research
Defect and Diffusion Forum
Diffusion Foundations and Materials Applications
Journal of Metastable and Nanocrystalline Materials
Journal of Nano Research
Key Engineering Materials
Materials Science Forum
Nano Hybrids and Composites
Solid State Phenomena
Engineering Series
Advances in Science and Technology
Construction Technologies and Architecture
Engineering Headway
Ultra Clean Processing of Semiconductor Surfaces IX
Subtitle:
UCPSS 2008
Description:
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The contents of this publication include every conceivable issue related to contamination, cleaning and surface preparation during mainstream large-scale integrated circuit manufacture. Typically, silicon is used as the main semiconductor substrate. However, other semiconducting materials such as SiGe and SiC are currently being used in the source-sink junction areas, and materials such as Ge and III-V compounds are being considered for the transistor channel region of future-generation devices.
The contents of this publication include every conceivable issue related to contamination, cleaning and surface preparation during mainstream large-scale integrated circuit manufacture. Typically, silicon is used as the main semiconductor substrate. However, other semiconducting materials such as SiGe and SiC are currently being used in the source-sink junction areas, and materials such as Ge and III-V compounds are being considered for the transistor channel region of future-generation devices.
Purchase this book:
eBook
978-3-03813-282-0
$198.00 *
Print
978-3-908451-64-8
$292.00
eBook+Print
978-3-908451-64-8
$392.00 *
* 1-User Access (Single User-Price). For Multi-User-Price please fill a contact form
Info:
eBook:
ToC:
Editors:
Paul Mertens, Marc Meuris and Marc Heyns
THEMA:
TGM
BISAC:
SCI077000
Keywords:
Details:
Selected, peer reviewed papers from the 9th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), held in Bruges, Belgium, September 22-24, 2008
Pages:
412
Year:
2009
ISBN-13 (softcover):
9783908451648
ISBN-13 (CD):
9783908454038
ISBN-13 (eBook):
9783038132820
Permissions CCC:
Permissions PLS:
Share: