Defect Engineering Radiation Tolerant Silicon Detectors

Abstract:

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Periodical:

Solid State Phenomena (Volumes 57-58)

Edited by:

C. Claeys, J. Vanhellemont, H. Richter and M. Kittler

Pages:

221-232

DOI:

10.4028/www.scientific.net/SSP.57-58.221

Citation:

B.C. MacEvoy and S.J. Watts, "Defect Engineering Radiation Tolerant Silicon Detectors", Solid State Phenomena, Vols. 57-58, pp. 221-232, 1997

Online since:

July 1997

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Price:

$35.00

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