Silicon Plates Homogeneity Diagnostics Method by Means of Semiconductor-Electrolyte Structure Surface Photovoltage Measurement

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Periodical:

Solid State Phenomena (Volumes 6-7)

Edited by:

M. Kittler

Pages:

457-460

DOI:

10.4028/www.scientific.net/SSP.6-7.457

Citation:

A.O. Arackelyan et al., "Silicon Plates Homogeneity Diagnostics Method by Means of Semiconductor-Electrolyte Structure Surface Photovoltage Measurement", Solid State Phenomena, Vols. 6-7, pp. 457-460, 1989

Online since:

January 1989

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$35.00

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