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The Noise Spectroscopy of Defects and Impurities in Compensated Silicon
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HomeSolid State PhenomenaSolid State Phenomena Vols. 6-7The Noise Spectroscopy of Defects and Impurities...

The Noise Spectroscopy of Defects and Impurities in Compensated Silicon

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Gettering and Defect Engineering in Semiconductor Technology III

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Periodical:

Solid State Phenomena (Volumes 6-7)

Pages:

449-452

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.6-7.449

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Online since:

January 1989

Authors:

Z.N. Adamyan, V.M. Arutyunyan, Z.H. Mkhitaryan

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© 1989 Trans Tech Publications Ltd. All Rights Reserved

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