• Registration Log In
  • For Libraries
  • For Publication
  • Open Access
  • Downloads
  • About Us
  • Contact Us
For Libraries For Publication Open Access Downloads About Us Contact Us
Paper Titles
The Role of Oxidant in HF-Based Solution for Noble Metal Removal from Substrate
p.267
Effect of Surface Charge and Fluid Properties on Particle Removal Characteristics of a Surface-Optimized REB Filter
p.271
Pattern Dependent Corrosion Effects in HF Based Post Cu CMP Cleanings
p.275
Effect of Copper on the Breakthrough Voltage of Poly-Si - Poly-Si Capacitors
p.279
New Insights into Particle Adhesion
p.283
SC-1 Clean Improvements for Post STI CMP
p.291
Contamination and Cleaning of Oxide Areas Exposed During Copper CMP in Hydroxylamine Based Slurries
p.295
Post Copper CMP: a Two Steps Cleaning Recipe
p.299
Silicon Surface Cleaning after Spacer Dry Etching
p.303
HomeSolid State PhenomenaSolid State Phenomena Vols. 76-77New Insights into Particle Adhesion

New Insights into Particle Adhesion

Article Preview
Article Preview
Article Preview

Abstract:

Access through your institution
You might also be interested in these eBooks
Ultra Clean Processing of Silicon Surfaces V View Preview

Info:

Periodical:

Solid State Phenomena (Volumes 76-77)

Pages:

283-290

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.76-77.283

Citation:

Cite this paper

Online since:

January 2001

Authors:

Sean Eichenlaub, Kevin Cooper, Anand Gupta, Stephen Beaudoin

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2001 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

References

This article has no references.

Cited by
Related Articles
Citation
Add To Cart

Paper price:

After payment, you will receive an email with instructions and a link to download the purchased paper.

You may also check the possible access via personal account by logging in or/and check access through your institution.

Back
Add To Cart

This paper has been added to your cart

Back To Cart
  • For Libraries
  • For Publication
  • Insights
  • Downloads
  • About Us
  • Policy & Ethics
  • Contact Us
  • Imprint
  • Privacy Policy
  • Sitemap
  • All Conferences
  • All Special Issues
  • All News
  • Open Access Partners

© 2025 Trans Tech Publications Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies. For open access content, terms of the Creative Commons licensing CC-BY are applied.
Scientific.Net is a registered trademark of Trans Tech Publications Ltd.