Formation and Current-Voltage Characteristics of SiC/Si-dot/SiC Resonant Tunneling Diodes

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Periodical:

Solid State Phenomena (Volumes 78-79)

Edited by:

H. Tomokage and T. Sekiguchi

Pages:

157-164

DOI:

10.4028/www.scientific.net/SSP.78-79.157

Citation:

Y. Ikoma et al., "Formation and Current-Voltage Characteristics of SiC/Si-dot/SiC Resonant Tunneling Diodes", Solid State Phenomena, Vols. 78-79, pp. 157-164, 2001

Online since:

April 2001

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$35.00

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