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HomeSolid State PhenomenaSolid State Phenomena Vols. 78-79Scanning Probe Field Emission Current Measurements...

Scanning Probe Field Emission Current Measurements on Polycrystalline Diamond Films

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Abstract:

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Periodical:

Solid State Phenomena (Volumes 78-79)

Pages:

177-182

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79.177

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Cite this paper

Online since:

April 2001

Authors:

H. Wakimoto, H. Tomokage, Young Do Kim, W. Choi, Y. Iseri, T. Ando

Keywords:

CITS, Field Emission, Polycrystalline Diamond Films, Scanning Probe Measurements, STM

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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