Defect Characteristics in Sulfur-Implanted CVD Homoepitaxial Diamond
p.171
p.171
Scanning Probe Field Emission Current Measurements on Polycrystalline Diamond Films
p.177
p.177
Surface Characterization of Plasma Etched DLC Films by Scanning Tunneling Microscopy and Atomic Force Microscopy
p.183
p.183
Field Emission Characteristics of Plasma Enhanced Chemical Vapor Deposited Diamond-Like Carbon Films Using Scanning Probe Measurements
p.191
p.191
Defects Analysis of Diamond Films in Cross Section Using Cathodoluminescence and High-Resolution Transmission Electron Microscopy
p.197
p.197
Radiation Induced Lattice Defects in n-MOSFETs and Their Effects on Device Performance
p.205
p.205
MC-IR-LST and TEM Combined Analysis of Defects in the OSF-Ring of Cz-Silicon Crystals
p.211
p.211
An In-Situ Observation of Dislocations and Crystal-Melt Interface during the Melting of Silicon
p.217
p.217
Negative Photoconductivity in Polycrystalline Silicon Films Doped with Phosphorus
p.225
p.225
Defects Analysis of Diamond Films in Cross Section Using Cathodoluminescence and High-Resolution Transmission Electron Microscopy
Abstract:
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Periodical:
Solid State Phenomena (Volumes 78-79)
Pages:
197-204
Citation:
Online since:
April 2001
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Сopyright:
© 2001 Trans Tech Publications Ltd. All Rights Reserved
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