MC-IR-LST and TEM Combined Analysis of Defects in the OSF-Ring of Cz-Silicon Crystals

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Periodical:

Solid State Phenomena (Volumes 78-79)

Edited by:

H. Tomokage and T. Sekiguchi

Pages:

211-216

DOI:

10.4028/www.scientific.net/SSP.78-79.211

Citation:

C. Frigeri et al., "MC-IR-LST and TEM Combined Analysis of Defects in the OSF-Ring of Cz-Silicon Crystals", Solid State Phenomena, Vols. 78-79, pp. 211-216, 2001

Online since:

April 2001

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$35.00

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