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Solid State Phenomena
Vol. 89
Solid State Phenomena
Vol. 88
Solid State Phenomena
Vol. 87
Solid State Phenomena
Vols. 85-86
Solid State Phenomena
Vols. 82-84
Solid State Phenomena
Vols. 80-81
Solid State Phenomena
Vols. 78-79
Solid State Phenomena
Vols. 76-77
Solid State Phenomena
Vols. 73-75
Solid State Phenomena
Vol. 72
Solid State Phenomena
Vol. 71
Solid State Phenomena
Vols. 69-70
Solid State Phenomena
Vols. 67-68

Solid State Phenomena Vols. 78-79

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79

ToC:

Table of Contents

Paper Title Page

Deep Levels in Bulk-ZnSe Grown by Bridgman Method
Authors: M. Yoneta, T. Kubo, K. Ohmori, K. Yoshino, M. Ohishi, H. Saito
367
Characterization of Defects in 6H-Type Epitaxially Grown Silicon Carbide Wafer by Cathodoluminescence Microscopy
Authors: Toshiyuki Isshiki, Hiroshi Saijo, Shigehiro Nishino, M. Shiojiri
377
The Relaxation of the ZnO Single Crystals (000-1) Surface
Authors: Hideyuki Maki, Noboru Ichinose, Naoki Ohashi, Hajime Haneda, M. Tanaka
381
TEM Observation of Barium Titanate Thin Films Consisting of Nano-Sized Single Crystals Prepared by Sol-Gel Processing
Authors: Y. Yamashita, N. Kurata, Makoto Kuwabara
387
The Investigation of Charge Transport Properties of SOI Semiconductor Devices Using a Heavy Ion Microbeam
Authors: Toshio Hirao, Jamie Steward Laird, H. Mori, S. Onoda, Hisayoshi Itoh
395
A System for Ultra-Fast Transient Ion and Pulsed Laser Current Microscopies as a Function of Temperature
Authors: Jamie Steward Laird, Toshio Hirao, S. Onoda, H. Mori, Hisayoshi Itoh
401
Visualization of Electron Beam Charge Storage and Thermal Release in Thin Insulating Layers
Authors: Hans Joachim Fitting, Th. Hingst, E. Schreiber
407
Development of an Ultra-Precision Positioner and its Applications
Authors: Yoshiya Egashira, Kouji Kosaka, Shinji Takada, Tetsuya Iwabuchi, Misawo Shibata, Keiichi Nagamoto, Hiroshi Kubota
413
Photoabsorption Spectroscopy on Nanometer Scale by Scanning Tunneling Microscopy
Authors: A. Hida, Y. Mera, Koji Maeda
419
Scanning Capacitance Microscopy on Semiconductor Materials
Authors: Vito Raineri, Filippo Giannazzo
425

Showing 51 to 60 of 60 Paper Titles

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