Solid State Phenomena Vols. 78-79

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https://doi.org/10.4028/www.scientific.net/SSP.78-79

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Negative Photoconductivity in Polycrystalline Silicon Films Doped with Phosphorus

Authors: Masashi Nakabayashi, H. Ohyama, Eddy Simoen, M. Ikegami, Cor Claeys, K. Kobayashi, M. Yoneoka, Y. Takami, H. Sunaga, H. Takizawa, K. Miyahara

225

Effects of Lattice Defects on Degradation of Flash Memory Cell

Authors: K. Kobayashi, H. Ohyama, Masashi Nakabayashi, Eddy Simoen, Cor Claeys, K. Kudou, M. Yoneoka, K. Hayama, S. Kohiki

231

Electron Beam Induced Current Contrast of Oxygen Precipitation Related Defects in Czochralski Silicon

Authors: Toshiaki Ono, Tsutomu Sasaki, Hary Kirk, George A. Rozgonyi

237

Modeling the Influence of Dislocations on Minority Carrier Diffusion Length in Silicon as a Function of Dislocation Contamination

Authors: Winfried Seifert, Martin Kittler

253

Defect Characterization in Multicrystalline Silicon Using Scanning Techniques

Authors: Sergei S. Ostapenko, I. Tarasov, Juris P. Kalejs

259

Minority Carrier Lifetime Scan Maps Applied to Metallic Impurity Detection in Silicon Wafers

Authors: Olivier Palais

267

Surface Concentration Dependence of Diffusion Profile Shape for Phosphorus in Si

Authors: Y. Banno, T. Ichino, H. Uchida, Masaya Ichimura, Eisuke Arai, Masayuki Yoshida

275

Rapid Diffusion of Titanium along Grain Boundaries in Polysilicon during Electron Beam Evaporation

Authors: Katsuhiro Yokota, Takamasa Kobayashi, Kazuhiro Nakamura

281

EBIC/XPS Study of the Antimony Equilibrium Segregation at Germanium Surface

Authors: Nouar Tabet

289

Luminescence Studies on In_xGa_1-xN/GaN Multiple Quantum Wells by Selective Excitation Spectroscopy

Authors: C. Sasaki, M. Iwata, Y. Yamada, Tsunemasa Taguchi, S. Watanabe, M.S. Minsky, T. Takeuchi, R. Schneider, N. Yamada

297