Solid State Phenomena Vols. 78-79

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https://doi.org/10.4028/www.scientific.net/SSP.78-79

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Formation and Current-Voltage Characteristics of SiC/Si-dot/SiC Resonant Tunneling Diodes

Authors: Yoshifumi Ikoma, T. Tada, K. Uchiyama, Fumio Watanabe, Teruaki Motooka

157

Excitonic Emission from High-Quality Homoepitaxial Diamond Film

Authors: Hideyuki Watanabe, Takashi Sekiguchi, Hideyo Okushi

165

Defect Characteristics in Sulfur-Implanted CVD Homoepitaxial Diamond

Authors: Mitsuru Hasegawa, M. Ogura, Daisuke Takeuchi, Sadanori Yamanaka, Hideyuki Watanabe, Shien Ri, Naoto Kobayashi, Hideyo Okushi, Takashi Sekiguchi

171

Scanning Probe Field Emission Current Measurements on Polycrystalline Diamond Films

Authors: H. Wakimoto, H. Tomokage, Young Do Kim, W. Choi, Y. Iseri, T. Ando

177

Surface Characterization of Plasma Etched DLC Films by Scanning Tunneling Microscopy and Atomic Force Microscopy

Authors: E.R. Hwang, W. Choi, Y. Iseri, H. Tomokage

183

Field Emission Characteristics of Plasma Enhanced Chemical Vapor Deposited Diamond-Like Carbon Films Using Scanning Probe Measurements

Authors: W. Choi, E.R. Hwang, N. Nomura, S. Itose, Y. Iseri, T. Ando, Young Do Kim, H. Tomokage

191

Defects Analysis of Diamond Films in Cross Section Using Cathodoluminescence and High-Resolution Transmission Electron Microscopy

Authors: Daisuke Takeuchi, Hideyuki Watanabe, Sadanori Yamanaka, Hidetaka Sawada, Hideki Ichinose, Takashi Sekiguchi, Hideyo Okushi

197

Radiation Induced Lattice Defects in n-MOSFETs and Their Effects on Device Performance

Authors: K. Kobayashi, H. Ohyama, Masashi Nakabayashi, Eddy Simoen, Cor Claeys, Y. Takami, M. Yoneoka, K. Hayama, S. Kohiki

205

MC-IR-LST and TEM Combined Analysis of Defects in the OSF-Ring of Cz-Silicon Crystals

Authors: Cesare Frigeri, M. Ma, T. Irisawa, Tomoya Ogawa

211

An In-Situ Observation of Dislocations and Crystal-Melt Interface during the Melting of Silicon

Authors: Yuren Wang, Koichi Kakimoto

217