Volumes

Solid State Phenomena
Vol. 92

Solid State Phenomena
Vols. 90-91

Solid State Phenomena
Vol. 89

Solid State Phenomena
Vol. 88

Solid State Phenomena
Vol. 87

Solid State Phenomena
Vols. 85-86

Solid State Phenomena
Vols. 82-84

Solid State Phenomena
Vols. 80-81

Solid State Phenomena
Vols. 78-79

Solid State Phenomena
Vols. 76-77

Solid State Phenomena
Vols. 73-75

Solid State Phenomena
Vol. 72

Solid State Phenomena
Vol. 71

HomeSolid State PhenomenaSolid State Phenomena Vols. 82-84

Solid State Phenomena Vols. 82-84

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.82-84

Export:

ToC:

Table of Contents

<<
<
…
9
10
11
12
13
>

Paper Title Page

Crystalline Silicon for Solar Cells

Authors: Martin Kittler, Wolfgang Koch

695

Measurement of the Normalized Recombination Strength of Dislocations in Multicrystalline Silicon Solar Cells

Authors: Markus Rinio, Stefan Peters, Martina Werner, Alexander Lawerenz, Hans Joachim Möller

701

Oxygen Annealing Behavior in Multicrystalline Silicon

Authors: De Ren Yang, Hans Joachim Möller

707

Three-Dimensional Emitter Based on Locally Enhanced Diffusion (TREBLE) Structure: Modeling and Formation

Authors: S. Bourdais, A. Slaoui, G. Beaucarne, Jef Poortmans, E. Christoffel, A. Zerga

713

Effective Gettering Mechanisms in Solar Multicrystalline Materials

Authors: A.A. Efremov, A.A. Evtukh, N.I. Klyui, V.G. Litovchenko, V. Popov, Yu. Rassamakin, A.V. Sarikov, C. Häßler, Wolfgang Koch

719

Strain Characterisation at the nm Scale of Deep Sub-Micron Devices by Convergent-Beam Electron Diffraction

Authors: Aldo Armigliato, R. Balboni, A. Benedetti, G.P. Carnevale, A.G. Cullis, S. Frabboni, D. Piccolo

727

Gate-Oxide Integrity Evaluation Using Non-Ideal Metal-Oxide-Silicon Capacitor Structures

Authors: Teimuraz Mchedlidze

735

Lock-In IR-Thermography – A Novel Tool for Material and Device Characterization

Authors: S. Huth, Otwin Breitenstein, A. Huber, D. Dantz, U. Lambert, F. Altmann

741

Characterisation of Surface and Near-Surface Regions in High-Purity Cz Si

Authors: Antonio Castaldini, Daniela Cavalcoli, Anna Cavallini, T. Minarelli, E. Susi

747

A Technique for Delineating Defects in Silicon

Authors: Luciano Mule'Stagno

753

<<
<
…
9
10
11
12
13
>