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HomeSolid State PhenomenaSolid State Phenomena Vols. 82-84

Solid State Phenomena Vols. 82-84

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.82-84

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Paper Title Page

SEM Vision Periodic Defect Review and Characterization after Inter-Metal Dielectric Deposition

Authors: Stefano Ventola, Julien Fort, Francesco La Spada, Paolo Maniscalco

759

Ellipsometric Study of Ion-Implantation Damage in Single-Crystal Silicon - An Advanced Optical Model

Authors: P. Petrik, O. Polgár, T. Lohner, M. Fried, N.Q. Khánh, J. Gyulai

765

Evaluation of Effective Carrier Lifetime in Epitaxial Silicon Layers

Authors: Hele Väinölä, J. Storgårds, Marko Yli-Koski, Juha Sinkkonen

771

Spatial Distribution of Strain and Phases in Si Nano-Indentation Analysed by Raman Mapping

Authors: F. Demangeot, P. Puech, V. Paillard, V. Domnich, Yu.G. Gogotsi

777

Structure and Stability of Thin Praseodymium Oxide Layers on Si(001)

Authors: Hans Joachim Müssig, Jaroslaw Dąbrowski, K. Ignatovich, J.P. Liu, V. Zavodinsky, H.J. Osten

783

Structural Investigations of Praseodymium Oxide Epitaxially Grown on Silicon

Authors: P. Zaumseil, E. Bugiel, J.P. Liu, H.J. Osten

789

1D-ACAR Studies of As-Grown Impurity Centers in Silicon

Authors: N.Yu. Arutyunov, V.Yu. Trashchakov

795

Characterization of Interfacial States at Silicon Bicrystals

Authors: G.N. Kamaev, S.V. Golod, E.M. Skok, A.K. Fedotov, A.V. Mazanik

801

Minority Carrier Diffusion Lengths in Silicon Doped Gallium Nitride Thin Films Measured by Electron Beam Induced Current

Authors: C. Grazzi, M. Albrecht, Horst P. Strunk, Z. Bougrioua, I. Moerman

807

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