HOME CONTACT My eBook

Username: Password:

> @scientific.net

Polycrystalline Semiconductors V

Solid State Phenomena Volumes 67 - 68

• Papers
• Abstracts
• buy eBook

• p119 Low-Temperature Deposition of Microcrystalline Silicon by Microwave Plasma-Enhanced Sputtering   [ 427 K ]
  Authors: P. Müller, W.M. Holber, W. Henrion, E. Nebauer, Viktor Schlosser, B. Selle, Irina Sieber, W. Fuhs
• p125 Influence of Deposit Thickness on the Microstructure and Surface Roughness of Silicon Films Deposited from Silane   [ 491 K ]
  Authors: B. Caussat, J.P. Couderc, L. Vasquez, A. Figueras, A. Vander Lee, D. Cot, Jean Durand, V. Paillard, E. Scheid, B. Legros-de Mauduit, A. Vilà, J.R. Morante
• p131 Adaptation of Microelectronics Simulator to the Polycrystalline Silicon Technology   [ 344 K ]
  Authors: T. Gaillard, H. Lhermite, O. Bonnaud, R. Rogel
• p137 Thickness Control of the Amorphous Buffer Layer of Hydrogenated Nanocrystalline Silicon: Effect of the Dopant Concentration   [ 280 K ]
  Authors: F. Gourbilleau, A. Achiq, P. Voivenel, Richard Rizk
• p143 Structure Dependence of the Electrical Conductivity of Hydrogenated Nanocrystalline Silicon Films   [ 313 K ]
  Authors: A. Achiq, Richard Rizk, F. Gourbilleau, P. Voivenel, B. Garrido, J.L. Pérez-Rodríguez, J.R. Morante
• p149 Highly Doped Microcrystalline SiGe Films: Structure and Transport Properties   [ 274 K ]
  Authors: F. Edelman, T. Raz, Y. Komem, M. Stölzer, P. Zaumseil
• p155 Photoluminescence Measurements of Microcrystalline Silicon   [ 204 K ]
  Authors: M. Meister, Joerg Weber, M. Furtsch, H. Muenzel
• p161 Silicon Produced by Thermal Chemical Vapour Deposition on Ceramic Substrates for Photovoltaic Applications   [ 335 K ]
  Authors: A.J.M.M. Van Zutphen, A. Von Keitz, M. Zeman, J.W. Metselaar
• p169 Grain Matrix Made with Excimer-Laser Crystallization of Thin Silicon Films   [ 491 K ]
  Authors: P.Ch. Van der Wilt, Ryoichi Ishihara
• p175 Grain Boundary Location Control by Patterned Metal Film in Excimer Laser Crystallized Polysilicon   [ 673 K ]
  Authors: L. Mariucci, R. Carluccio, A. Pecora, G. Fortunato, F. Massussi, V. Foglietti, D. Della Sala, J. Stoemenos
• p181 Characterisation of Excimer Laser Crystallised Polysilicon by X-Ray Diffraction and by Channeling Contrast in a Scanning Electron Microscope   [ 355 K ]
  Authors: S. Loreti, M. Vittori, L. Mariucci, G. Fortunato
• p187 Multicrystalline Silicon Thin Films: Laser Crystallization Conditions and Properties   [ 627 K ]
  Authors: G. Andrä, J. Bergmann, Fritz Falk, E. Ose, N.D. Sinh
• p193 Laser-Crystallized Polycrystalline Silicon on Glass for Photovoltaic Applications   [ 327 K ]
  Authors: R. Dassow, J.R. Köhler, M. Grauvogl, R.B. Bergmann, Jens Werner
• p199 Properties of Poly-Si Obtained by Solid Phase Crystallization of Differently Produced a:Si:H Thin Films   [ 408 K ]
  Authors: M.L. Addonizio, P. Delli Veneri, G. Fameli, S. Loreti, C. Minarini, C. Privato, G. Sinno, E. Terzini, M. Vancini
• p205 Transmission Electron Microscopy and Raman Analysis of the Crystallisation Process of a-Si on Glass for Low Seed Density   [ 699 K ]
  Authors: J.L. Alay, A. Vilà, J.M. Morante, T. Mohammed-Brahim, M. Sarret, O. Bonnaud