Polycrystalline Semiconductors V
Solid State Phenomena Volumes 67 - 68
doi:10.4028/www.scientific.net/SSP.67-68
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p415
Photoelectrical Properties of In/p-(Cu,Ag)(In,Ga) (Se,Te)2 Surface-Barrier Structures
[
300 K
]
Authors: Yu. V. Rud', V.Yu. Rud', V.F. Gremenok, E.P. Zaretskaya, D.D. Krivolap, I.V. Bodnar, S.L. Sergeev-Nekrasov
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p421
Polarization Photosensitivity of Polycrystalline-Film Cu(In,Ga)Se2/CdS/ZnO Structures
[
212 K
]
Authors: V.Yu. Rud', Yu. V. Rud', H.-W. Schock
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p427
Photoluminescence Study of Cu(GaxIn1-x)3Se5 and CuIn3(SxSe1-x)5 Crystals with 0≤x≤1
[
194 K
]
Authors: F. Guastavino, K. Zeaiter, L. Djellal, Yanuar, D. Bayaa, M. Abdelali, C. Llinares
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p435
Fullerene-Based Thin Films as a Novel Polycrystalline Semiconductor
[
747 K
]
Authors: E.A. Katz
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p447
Low Dislocation Density Multicrystalline Silicon for Photovoltaic Applications
[
427 K
]
Authors: C. Häßler, E.-U. Reisner, Wolfgang Koch, A. Müller, D. Franke, T. Rettelbach
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p453
Phase Field Modeling of the Growth of mc-Silicon from the Melt
[
328 K
]
Authors: Markus Apel, Ingo Steinbach
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p459
Low-Temperature Silicon Epitaxy by Ion-Assisted Deposition
[
370 K
]
Authors: L. Oberbeck, R.B. Bergmann, N. Jensen, S. Oelting, Jens Werner
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p465
Profiled Poly-Silicon Films by Hot-Wire Chemical Vapour Deposition for Solar Cells on Cheap Metal Substrate
[
651 K
]
Authors: Jatindra K. Rath, F.D. Tichelaar, Ruud E.I. Schropp
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p471
Optical Characterization of Ru2Si3 and Ru2Ge3 by Various Spectroscopic Methods and by Band Structure Calculations
[
278 K
]
Authors: W. Henrion, M. Rebien, V.N. Antonov, O. Jepsen
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p477
Cubic Silicon Carbide Films Grown by Reactive Magnetron Sputtering at Relatively Low Temperature
[
322 K
]
Authors: S. Kerdiles, F. Gourbilleau, Richard Rizk, J.L. Pérez-Rodríguez, B. Garrido, O. González-Varona, L. Calvo-Barrio, J.R. Morante
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p485
Defect Engineering in Polycrystalline Silicon Using Ultrasound
[
551 K
]
Authors: Sergei S. Ostapenko
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p497
Defects Modification by Ultrasound in Crystals
[
320 K
]
Authors: I.V. Ostrovskii, Ju.M. Khalack, A.B. Nadtochii, H.G. Walther
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p503
Method for the Evaluation of the Influence of Gettering and Bulk Passivation on Non-Uniform Block-Cast Multicrystalline Si Solar Cells
[
383 K
]
Authors: H. Nagel, A.G. Aberle, S. Narayanan
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p509
Influence of Hydrogen Plasma Treatment on Electric Properties of Polycrystalline CdSxSe1-x Films
[
345 K
]
Authors: S. Manego, A.V. Mazanik, M. Tarasik, Yu. Trofimov, A.K. Fedotov, Alexander G. Ulyashin, A. Yanchenko
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p515
Wet-Chemically Passivated Silicon Interfaces: Characterization by Surface Photovoltage Measurements, and Spectroscopic Ellipsometry Methods
[
380 K
]
Authors: H. Angermann, W. Henrion, A. Röseler, M. Rebien