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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 183-185Study of Diffusion and Defects by Medium-Energy...

Study of Diffusion and Defects by Medium-Energy Coaxial Impact-Collision Ion Scattering Spectroscopy

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Defects and Diffusion in Semiconductors III

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Periodical:

Defect and Diffusion Forum (Volumes 183-185)

Pages:

207-214

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.183-185.207

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Online since:

August 2000

Authors:

Takayuki Kobayashi, C.F. McConville, J. Nakamura, G. Dorenbos, H. Sone, T. Katayama, M. Aono

Keywords:

Buried Layers, First-Principle, Lattice Location, Solid Solution, Solid-Phase Epitaxial Growth, Surface Diffusion

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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