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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 183-185Transmission Electron Microscopic Study of...

Transmission Electron Microscopic Study of Intersecting Stacking Faults in ZnSe/GaAs(001) Epilayers and (SiGe)/Si(001) Multilayers

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Defects and Diffusion in Semiconductors III

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Periodical:

Defect and Diffusion Forum (Volumes 183-185)

Pages:

215-230

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.183-185.215

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Online since:

August 2000

Authors:

K.K. Fung, Ning Wang

Keywords:

Dislocation Dipoles, SiGe Epilayers, Stacking Fault Pyramids, Stair-Rod Dislocations, Tetrahedra, Trapezoids, Tube, ZnSe Epilayers

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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