Transmission Electron Microscopic Study of Intersecting Stacking Faults in ZnSe/GaAs(001) Epilayers and (SiGe)/Si(001) Multilayers

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Periodical:

Defect and Diffusion Forum (Volumes 183-185)

Edited by:

D.J. Fisher

Pages:

215-230

DOI:

10.4028/www.scientific.net/DDF.183-185.215

Citation:

K.K. Fung and N. Wang, "Transmission Electron Microscopic Study of Intersecting Stacking Faults in ZnSe/GaAs(001) Epilayers and (SiGe)/Si(001) Multilayers", Defect and Diffusion Forum, Vols. 183-185, pp. 215-230, 2000

Online since:

August 2000

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