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Vols. 183-185

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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 183-185

Defect and Diffusion Forum Vols. 183-185

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.183-185

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Paper Title Page

Defects and Morphologies in In_0.8Ga_0.2As/InAlAs/InP(001) for High Electron-Mobility Transistors

Authors: J. Wu, F. Lin

147

Diffusion of Zinc in InP, InAsP and InGaAs by the Metal-Organic Vapor-Phase Diffusion Technique

Authors: M. Wada, K. Sakakibara, T. Umezawa, S. Nakajima, S. Araki, T. Kudou, T. Ueda

153

Effect of Implant Temperature on Extended Defects Craeted by Ion Implantation in Silicon

Authors: J. Wong-Leung, S. Fatima, C. Jagadish, J.D. FitzGerald

163

Diffusion and Electrical Properties of Nickel in Silicon

Authors: S. Tanaka, Tetsuo Ikari, H. Kitagawa

171

XPEEM Study of Liquid Au-Si Droplets on Si(111) near to the Eutectic Point

Authors: B. Ressel, S. Heun, T. Schmidt, K.C. Prince

181

Effect of Surface Proximity upon Point Defects in Silicon

Authors: V. Krishnamoorthy, M. Puga Lambers, Kevin S. Jones

189

Energetics of Extrinsic Defects in Si and their Role in Nonequilibrium Dopant Diffusion

Authors: Fuccio Cristiano, B. Colombeau, A. Claverie

199

Study of Diffusion and Defects by Medium-Energy Coaxial Impact-Collision Ion Scattering Spectroscopy

Authors: Takayuki Kobayashi, C.F. McConville, J. Nakamura, G. Dorenbos, H. Sone, T. Katayama, M. Aono

207

Transmission Electron Microscopic Study of Intersecting Stacking Faults in ZnSe/GaAs(001) Epilayers and (SiGe)/Si(001) Multilayers

Authors: K.K. Fung, Ning Wang

215

Analytical In-Diffusion Profiles of Dopants in Semiconductors

Authors: E. Antoncik

231

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