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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 183-185Defects and Morphologies in...

Defects and Morphologies in In_0.8Ga_0.2As/InAlAs/InP(001) for High Electron-Mobility Transistors

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Defects and Diffusion in Semiconductors III

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Periodical:

Defect and Diffusion Forum (Volumes 183-185)

Pages:

147-152

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.183-185.147

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Online since:

August 2000

Authors:

J. Wu, F. Lin

Keywords:

In_0.8Ga_0.2As/InAlAs/InP, Misfit Dislocation, Surface Morphology

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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