Morphological, Structural and Electronic Damage on InAs and InSb Surfaces Induced by (Reactive) Ion Beam Etching

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Periodical:

Defect and Diffusion Forum (Volumes 183-185)

Edited by:

D.J. Fisher

Pages:

127-146

DOI:

10.4028/www.scientific.net/DDF.183-185.127

Citation:

F. Frost et al., "Morphological, Structural and Electronic Damage on InAs and InSb Surfaces Induced by (Reactive) Ion Beam Etching", Defect and Diffusion Forum, Vols. 183-185, pp. 127-146, 2000

Online since:

August 2000

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$35.00

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