Preface
Peak Voltage and Switching Slope Dependency of Gate Switching Instability in SiC MOSFET
p.1
p.1
Development and Evaluation of a 1.2kV SiC MOSFET-Based PTC Controller for Energy-Efficient xEV Heating Applications
p.9
p.9
A Multi-Manufacturer Test Campaign to Assess the Power Cycling Capability of Silicon Carbide MOSFETs in TO-247 Packages
p.17
p.17
Temperature Dependence of the AC-BTI in SiC MOSFETs
p.25
p.25
Reliability Challenges of SiC MOSFETs under Continuous Dual-Bias Stress in EV Applications
p.31
p.31
Gate Oxide Stability and Degradation Modes of Next Generation SiC MOSFETs
p.39
p.39
Impact of Packaging on Discrepancy of Datasheet Static Measurements of SiC Power MOSFETs in Bare Dies and TO-247 Packaged Form-Factors
p.47
p.47
Impact of the Negative Gate Bias on Short-Circuit Robustness of SiC MOSFETs with Measurements and Simulations
p.55
p.55
Preface
Abstract:
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