Electrical and Defect Characterization of Sputter Deposited Au and Cr Schottky Barrier Diodes on GaAs

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Periodical:

Materials Science Forum (Volumes 196-201)

Edited by:

M. Suezawa and H. Katayama-Yoshida

Pages:

1955-1960

DOI:

10.4028/www.scientific.net/MSF.196-201.1955

Citation:

S.A. Goodman et al., "Electrical and Defect Characterization of Sputter Deposited Au and Cr Schottky Barrier Diodes on GaAs", Materials Science Forum, Vols. 196-201, pp. 1955-1960, 1995

Online since:

November 1995

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$35.00

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