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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Electrical and Defect Characterization of Sputter...

Electrical and Defect Characterization of Sputter Deposited Au and Cr Schottky Barrier Diodes on GaAs

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

1955-1960

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.1955

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Online since:

November 1995

Authors:

S.A. Goodman, F. Danie Auret, Y. Leclerc

Keywords:

Defect, GaAs, Metastable, Sputter-Deposition

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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