Schottky Diodes on Si1-x-yGexCy Alloys: Measurement of Band Off-Set by DLTS

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

165-170

DOI:

10.4028/www.scientific.net/MSF.258-263.165

Citation:

M. Serpentini and G. Brémond, "Schottky Diodes on Si1-x-yGexCy Alloys: Measurement of Band Off-Set by DLTS", Materials Science Forum, Vols. 258-263, pp. 165-170, 1997

Online since:

December 1997

Export:

Price:

$35.00

In order to see related information, you need to Login.