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High Resolution Photoemission Study of the 6H-SiC/SiO₂ Interface
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HomeMaterials Science ForumMaterials Science Forum Vols. 264-268The Formation of Super-Disolcation/Micropipe...

The Formation of Super-Disolcation/Micropipe Complexes in 6H-SiC

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Periodical:

Materials Science Forum (Volumes 264-268)

Pages:

371-374

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.264-268.371

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Online since:

February 1998

Authors:

J. Giocondi, Gregory S. Rohrer, Marek Skowronski, Vijay Balakrishna, G. Augustine, H. McD. Hobgood, R.H. Hopkins

Keywords:

Atomic Force Microscope (AFM), Dislocation, Extended Defects, Micropipe

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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