High-Frequency EPR Studies of Shallow and Deep Boron Acceptors in 6H-SiC

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

587-590

DOI:

10.4028/www.scientific.net/MSF.264-268.587

Citation:

J. Schmidt et al., "High-Frequency EPR Studies of Shallow and Deep Boron Acceptors in 6H-SiC", Materials Science Forum, Vols. 264-268, pp. 587-590, 1998

Online since:

February 1998

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