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Observation of Metastable Defect in Electron Irradiated 6H-SiC
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Electrically Active Defects in n-Type 4H- and 6H-SiC
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Phonon Spectrum of Band-to-Band Optical Transitions in 6H-SiC as Determined by Optical Admittance Spectroscopy
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Electrical and Transmission Electron Microscopy Characterisation of 4H-SiC Homoepitaxial Mesa Diodes
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High-Temperature Annealing of 6H-SiC Single Crystals and the Site-Competition Processes
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Electronic Structure of Acceptors in Silicon Carbide
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HomeMaterials Science ForumMaterials Science Forum Vols. 264-268Electrical and Transmission Electron Microscopy...

Electrical and Transmission Electron Microscopy Characterisation of 4H-SiC Homoepitaxial Mesa Diodes

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Periodical:

Materials Science Forum (Volumes 264-268)

Pages:

573-576

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.264-268.573

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Online since:

February 1998

Authors:

A. Czerwinski, Jacek Ratajczak, J. Katcki, A. Bakowski, Mietek Bakowski

Keywords:

4H-SiC Diode, Electrical Characterisation, SiC Diode, SiC TEM

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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