Interface State Density at Implanted 6H SiC/SiO2 MOS Structures

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

861-864

DOI:

10.4028/www.scientific.net/MSF.264-268.861

Citation:

M. Bassler et al., "Interface State Density at Implanted 6H SiC/SiO2 MOS Structures", Materials Science Forum, Vols. 264-268, pp. 861-864, 1998

Online since:

February 1998

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$35.00

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