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Differential Absorption Measurement of Valence Band Splittings in 4H SiC
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Anisotropic Dielectric Function Properties of Semi-insulating 4H-SiC Determined from Spectroscopic Ellipsometry
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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Anisotropic Dielectric Function Properties of...

Anisotropic Dielectric Function Properties of Semi-insulating 4H-SiC Determined from Spectroscopic Ellipsometry

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

571-574

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.571

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Online since:

May 2000

Authors:

Morten Kildemo, M.B. Mooney, P.V. Kelly, C. Sudre, G.M. Crean

Keywords:

4H-SiC, Anisotropy, Birefringence, Dielectric Function, Ellipsometry

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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