Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy

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Periodical:

Materials Science Forum (Volumes 353-356)

Edited by:

G. Pensl, D. Stephani and M. Hundhausen

Pages:

393-396

Citation:

L. Masarotto et al., "Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy", Materials Science Forum, Vols. 353-356, pp. 393-396, 2001

Online since:

January 2001

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