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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356Electrochemical Characterization of p-Type...

Electrochemical Characterization of p-Type Hexagonal SiC

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

619-622

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.619

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Online since:

January 2001

Authors:

M. Kayambaki, Konstantinos Zekentes, Katerina Tsagaraki, Etienne Pernot, Rositza Yakimova

Keywords:

C-V, Doping Profile, Electrolytic Etching, Etch Pit

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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